四探针法 [
sì tàn zhēn fǎ]
[电子][计] four probe method
- 四探针法用在非常薄的样品,例如外延晶圆片和导电涂层上。
The four-point probe method is used on very thin samples such as epitaxial wafers and conductive coatings. - 测量电阻率的四探针法公式中,要求是点接触而且探针的排列有一定的形状。
The equation of four probes method for resistivity measurement requires point contacts and a definite configuration of probes array. - 利用X射线衍射仪、原子力和超导量子干涉仪、直流四探针法对其结构、磁电特性进行了系统的研究。
The structure and the magneto-electrical properties of the thin film are investigated using X ray diffractometer , super-conducting quantum interference device and DC four-probe method.