双折射片 birefringent plate
- 提出用旋转半波片-反射法测量半封闭玻璃制品应力,探讨以电光调制法为基础的微双折射光程差测量系统的稳定性。
The stability of micro-birefringence optical path difference measuring system based on electro-optic modulation method is studied. - 通过测量云母材料的厚度和相应厚度情况下作为λ/4波片使用所对应的波长,利用相位延迟与波长及厚度函数关系式直接求得云母的双折射率。
Through measuring the thickness of mica plates and the wavelengths at which they act as quarter wave phase retarders, the birefringence can be obtained in terms of the function relation between the phase delay, the wavelength and the thickness.
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